Dr. Xinqi Chen, Research Associate Professor, hosted a packed January Tech Talk, “XPS or ToF-SIMS?” on January 16, 2019.
In this tech talk, Xinqi gave a brief introduction of the principle and the applications of X-ray Photoelectron Spectroscopy (XPS) and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and discussed the strength and weakness of each tool.
