techniques: Scanned Probe Techniques
Scanned probe techniques rely on a sharp stylus (probe) that either contacts or nearly contacts a surface to provide range of different information. These tools can be applied to soft and hard materials alike and provide information about local mechanical properties, surface morphology, electrical properties and more.
SCANNING PROBE MICROSCOPY
SPM is the general umbrella technique for a suite of miroscopy tools that can provide everything from nanometer-scale surface images to local piezoelectric property measurements. By varying the type of probe and feedback mechanism, these tools can probe electrical, mechanical and magnetic properties from a range of different materials.
Our current range of SPM tools can be found in our SPID Facility.
NANOINDENTATION
Based on scanning probe microscopy, the nanoindentation technique allows for quantification of local mechanical properties. Due to the small probe size, this technique allows the detail investigation of local properties (hardness, modulus), in contrast to the bulk measurements provided by other indentation methods.
Our current range of Nanoindentation tools can be found in our SPID Facility.
CORRELATIVE FLUIDIC AFM/OPTICAL MICROSCOPY
Among the more unique toolsets in SHyNE, this technique allows for correlative optical microscopy and atomic force microscopy within a fluidic environment. This is particularly useful for biomechanical studies on cells or interrogation of hydrogels or other water-containing materials.
Our current range of correlative optical/AFM tools can be found in our SPID Facility.
Dr. Gajendra S. Shekhawat
SPID Facility Manager; Research Professor, Dept. of Material Science & Engineering
OFFICE: Tech AG94
(847) 491-3204 / Email