services: Surface Analysis
As the scale of materials and devices continues to decrease, the role of surfaces become more critical to performance. We have a large suite of tools to study surface morphology, chemistry and functional properties. Take advantage of our complementary toolsets and high-level technical expertise to tackles your problems in surface engineering.
RELEVANT TECHNIQUES:
SCANNING PROBE MICROSCOPY (SPM)
SPM is the general umbrella technique for a suite of miroscopy tools that can provide everything from nanometer-scale surface images to local piezoelectric property measurements. By varying the type of probe and feedback mechanism, these tools can probe electrical, mechanical and magnetic properties from a range of different materials.
Our current range of SPM tools can be found in our SPID Facility.
SCANNING ELECTRON MICROSCOPY (SEM)
Scanning electron microscopy (SEM) uses a focused electron probe to scan the surface of a sample. The electrons interact with the surface of the sample to produce a wide range of useful signals that can be used to provide high spatial resolution images, elemental composition, crystallographic information and more. Our instruments are capable of analyzing more traditional hard materials (metals, ceramics, etc.) as well as non-conductive or even hydrated samples by variable pressure/environmental SEM.
Our current range of SEM instruments can be found in our EPIC (SEM) Facility.
X-RAY DIFFRACTION (XRD)
X-ray diffraction (XRD) is a bulk measurement technique that can provide structural, chemical, and phase information of crystalline materials. By matching experimental data to spectral signatures, our instruments can be used to determine the identity of a variety of samples.
Our current range of XRD instruments can be found in our Jerome B. Cohen X-Ray Diffraction Facility and IMSERC Facility.