services: Contaminant and Particle Analysis
Our advanced analytical capabilities allow the identification of contaminants and particulates by elemental, chemical and morphological analysis. We can provide comprehensive quantitative composition analysis, particle size distributions and more. From individual atoms to large scale imaging, we retain the expertise to identify trace elements and undesired surface species on a wide range of materials.
RELEVANT TECHNIQUES:
SCANNING ELECTRON MICROSCOPY (SEM)
Scanning electron microscopy (SEM) uses a focused electron probe to scan the surface of a sample. The electrons interact with the surface of the sample to produce a wide range of useful signals that can be used to provide high spatial resolution images, elemental composition, crystallographic information and more. Our instruments are capable of analyzing more traditional hard materials (metals, ceramics, etc.) as well as non-conductive or even hydrated samples by variable pressure/environmental SEM.
Our current range of SEM instruments can be found in our EPIC (SEM) Facility.
TRANSMISSION ELECTRON MICROSCOPY (TEM)
Transmission electron microscopy (TEM) uses a high energy electron beam which is transmitted through a thin sample to provide information via the interaction of electrons with your sample. Modern TEM’s are a platform for a range of different types of experiments from atomic resolution imaging to structural analysis by electron diffraction to in situ or in operando methods, which provide controlled environments and allow application of stimuli to materials inside the microscope. Beyond imaging, TEM can be operated in Scanning TEM (S/TEM) mode to provide high spatial resolution elemental, chemical information and crystallographic information.
Our current range of SEM instruments can be found in our EPIC (TEM) Facility.
X-RAY FLUORESCENCE (XRF)
For chemical and compositional identification of materials, such as ceramics and metals, x-ray fluorescence is a particularly useful technique. Using this non-destructive characterization technique, the elemental constituents can be mapped across the sample, making it a valuable method for analyzing artwork and geological structures.
Our current range of XRF instruments can be found in the Jerome B. Cohen X-Ray Diffraction Facility.
MASS SPECTROMETRY
Mass Spectrometry measures the mass-to-charge ratio of ions from a sample, producing a mass spectrum to identify elemental or molecular species. This technique can be applied for a diverse set of research areas from pharmaceuticals to geology. Our tools can handle a range of samples and provide qualitative or quantitative analysis, with or without chromatographic separation.
Our current range of Mass Spectrometry tools can be found in the IMSERC Facility.
DYNAMIC LIGHT SCATTERING (DLS)
DLS techniques can be used to measure particle size distributions in solution. The technique can be applied to various types of particles and suspensions from proteins and polymers to inorganic particles. The same DLS systems can also often be used to measure zeta potential.
Our current range of DLS tools can be found in our KECK Facility and ANTEC Facility.
SCANNING PROBE MICROSCOPY (SPM)
SPM is the general umbrella technique for a suite of miroscopy tools that can provide everything from nanometer-scale surface images to local piezoelectric property measurements. By varying the type of probe and feedback mechanism, these tools can probe electrical, mechanical and magnetic properties from a range of different materials.
Our current range of SPM tools can be found in our SPID Facility.
CORRELATIVE FLUIDIC AFM/OPTICAL MICROSCOPY
Among the more unique toolsets in SHyNE, this technique allows for correlative optical microscopy and atomic force microscopy within a fluidic environment. This is particularly useful for biomechanical studies on cells or interrogation of hydrogels or other water-containing materials.
Our current range of correlative optical/AFM tools can be found in our SPID Facility.