techniques: Electrical & Physical Characterization

The electrical characterization tools available at our facility allow for directly measuring the electronic properties of a variety of material systems.

ELECTRICAL PROBE STATION

The electrical probe station is fitted with six high resolution micromanipulators in a vibration isolation stage. The system is interfaced with both a semiconductor parameter analyzer and an LCR meter, which makes it possible to readily measure the resistance, capacitance, or inductance of a sample of interest.

Our current range of electrical probe station setups can be found in our NUFAB Facility and the Prtizker Nanofabrication Facility.

The GIANTFab core facility at Northwestern also contains an electrical probe station housed in an inert-atmosphere glovebox for measurements of air- or moisture-sensitive samples including organic and perovskite semiconductors. That system is interfaced with a source measure unit. It also contains a solar simulator and a monochromatic light source for measurements of photoactive materials.

 

In Situ SEM NANOPROBE

For applications where precise placement of electrical probes are required, the in situ SEM nanoprobe can be used to probe small structures. This nanofabrication technique is especially useful for measuring the electrical properties of transistors on the nanometer length scale and electronic failure analysis.

Our current range of in situ SEM nanoprobe setups can be found in our EPIC Facility.

POLYMER CHARACTERIZATION

Our facilities offer broad polymer characterization capabilities from viscoelastic properties to thermal characterization.

Our current range of polymer characterization tools can be found in the IMSERC  and ANTEC Facilities.

Nasir Basit, PhD

Nasir Basit, PhD

NUFAB Director of Operations

Office: Tech FG73 
(847) 467-6201 / email