services: Dimensional Analysis
Reliable and reproducible dimensional metrology is critical to numerous research, development and manufacturing environments. We provide calibrated measurements of structures from the millimeter scale to the atomic scale using advanced instruments and traceable standards.
RELEVANT TECHNIQUES:
SCANNING ELECTRON MICROSCOPY (SEM)
Scanning electron microscopy (SEM) uses a focused electron probe to scan the surface of a sample. The electrons interact with the surface of the sample to produce a wide range of useful signals that can be used to provide high spatial resolution images, elemental composition, crystallographic information and more. Our instruments are capable of analyzing more traditional hard materials (metals, ceramics, etc.) as well as non-conductive or even hydrated samples by variable pressure/environmental SEM.
Our current range of SEM instruments can be found in our EPIC (SEM) Facility.
CORRELATIVE FLUIDIC AFM / OPTICAL MICROSCOPY
Among the more unique toolsets in SHyNE, this technique allows for correlative optical microscopy and atomic force microscopy within a fluidic environment. This is particularly useful for biomechanical studies on cells or interrogation of hydrogels or other water-containing materials.
Our current range of correlative optical/AFM tools can be found in our SPID Facility.
SCANNING PROBE MICROSCOPY (SPM)
SPM is the general umbrella technique for a suite of miroscopy tools that can provide everything from nanometer-scale surface images to local piezoelectric property measurements. By varying the type of probe and feedback mechanism, these tools can probe electrical, mechanical and magnetic properties from a range of different materials.
Our current range of SPM tools can be found in our SPID Facility.
TRANSMISSION ELECTRON MICROSCOPY (TEM)
Transmission electron microscopy (TEM) uses a high energy electron beam which is transmitted through a thin sample to provide information via the interaction of electrons with your sample. Modern TEM’s are a platform for a range of different types of experiments from atomic resolution imaging to structural analysis by electron diffraction to in situ or in operando methods, which provide controlled environments and allow application of stimuli to materials inside the microscope. Beyond imaging, TEM can be operated in Scanning TEM (S/TEM) mode to provide high spatial resolution elemental, chemical information and crystallographic information.
Our current range of SEM instruments can be found in our EPIC (TEM) Facility.