techniques: Ion Beam Techniques
The cornerstone of synthetic chemistry and biochemistry research, these tools allow the determination of chemical structure and molecular environment. Truly state of the art, SHyNE’s molecular characterization tools include NMR, mass spec, chromatography and more.
FOCUSED ION BEAM
The focused ion beam (FIB) tool uses high energy ions for directed removal of atoms from a target surface. Our instruments have the capability of site-specific milling, as well as depositing material onto a region of interest, which makes it very useful from the standpoint of nanofabrication.
Our current range of FIB instruments can be found in our EPIC Facility.
ATOM PROBE TOMOGRAPHY
Our current range of APT instruments can be found in the NUCAPT Facility.
SECONDARY ION MASS SPECTROMETRY
Secondary ion mass spectrometry (SIMS) is a surface analysis tool that involves the removal of atoms from the sample surface. By measuring the mass and charge of the atoms removed from the surface, elemental, isotopic, and molecular information of the constituents present within a few nanometers from the surface can be identified. This technique is particularly useful for quality assurance purposes in the semiconductor industry and characterization of nanoscale materials.
Our current range of SIMS instruments can be found in our Keck-II Facility.
Dieter Isheim, PhD
NUCAPT Manager, Research Associate Professor
Office: Cook Hall
847-491-3575 / Email