X-ray diffraction (XRD) is a bulk measurement technique that can provide structural, chemical, and phase information of crystalline materials. By matching experimental data to spectral signatures, our instruments can be used to determine the identity of a variety of samples.

Our current range of XRD instruments can be found in our Jerome B. Cohen X-Ray Diffraction Facility and IMSERC Facility.

Small and wide angle (SWAXS) x-ray scattering is a specialized x-ray technique that can provide structural information with high spatial resolution. Through this technique, our facility provides a method for acquiring structural information from samples that are traditionally challenging to probe using x-ray techniques, such as nanoscale and macromolecular structures.

Our current range of SWAXS instruments can be found in the Jerome B. Cohen X-Ray Diffraction Facility 

For chemical and compositional identification of materials, such as ceramics and metals, x-ray fluorescence is a particularly useful technique. Using this non-destructive characterization technique, the elemental constituents can be mapped across the sample, making it a valuable method for analyzing artwork and geological structures.

Our current range of XRF instruments can be found in the Jerome B. Cohen X-Ray Diffraction Facility.