services: Material Testing
SHyNE offers comprehensive capabilities for material testing to study mechanical, optical and thermal properties in addition to compositional, crystallographic and morphological analysis. We can handle a wide range of materials including metals, ceramics, polymers, composites and others. We actively develop and research new methods of linking material structure and properties to provide state-of-the-art solutions.
RELEVANT TECHNIQUES:
NANOINDENTATION
Based on scanning probe microscopy, the nanoindentation technique allows for quantification of local mechanical properties. Due to the small probe size, this technique allows the detail investigation of local properties (hardness, modulus), in contrast to the bulk measurements provided by other indentation methods.
Our current range of nanoindentation tools can be found in our SPID Facility.
RAMAN SPECTROSCOPY
Raman spectroscopy is a vibrational spectroscopy technique, traditionally used to identify the molecular “fingerprint” to help identify chemical structures. The technique is also widely used in the field of 2D materials and can provide additional information about material properties such as crystal orientation or internal stresses.
Our current range of Raman microscopy tools can be found in our SPID Facility.
SCANNING ELECTRON MICROSCOPY (SEM)
Scanning electron microscopy (SEM) uses a focused electron probe to scan the surface of a sample. The electrons interact with the surface of the sample to produce a wide range of useful signals that can be used to provide high spatial resolution images, elemental composition, crystallographic information and more. Our instruments are capable of analyzing more traditional hard materials (metals, ceramics, etc.) as well as non-conductive or even hydrated samples by variable pressure/environmental SEM.
Our current range of SEM instruments can be found in our EPIC (SEM) FACILITY.
TRANSMISSION ELECTRON MICROSCOPY (TEM)
Transmission electron microscopy (TEM) uses a high energy electron beam which is transmitted through a thin sample to provide information via the interaction of electrons with your sample. Modern TEM’s are a platform for a range of different types of experiments from atomic resolution imaging to structural analysis by electron diffraction to in situ or in operando methods, which provide controlled environments and allow application of stimuli to materials inside the microscope. Beyond imaging, TEM can be operated in Scanning TEM (S/TEM) mode to provide high spatial resolution elemental, chemical information and crystallographic information.
Our current range of SEM instruments can be found in our EPIC (TEM) Facility.
X-RAY DIFFRACTION (XRD)
X-ray diffraction (XRD) is a bulk measurement technique that can provide structural, chemical, and phase information of crystalline materials. By matching experimental data to spectral signatures, our instruments can be used to determine the identity of a variety of samples.
Our current range of XRD instruments can be found in our Jerome B. Cohen X-Ray Diffraction Facility and IMSERC Facility.
MASS SPECTROMETRY
Mass Spectrometry measures the mass-to-charge ratio of ions from a sample, producing a mass spectrum to identify elemental or molecular species. This technique can be applied for a diverse set of research areas from pharmaceuticals to geology. Our tools can handle a range of samples and provide qualitative or quantitative analysis, with or without chromatographic separation.
Our current range of Mass Spectrometry tools can be found in the IMSERC Facility.
POLYMER CHARACTERIZATION
Our facilities offer broad polymer characterization capabilities from viscoelastic properties to thermal characterization.
Our current range of polymer characterization tools can be found in the IMSERC Facility and ANTEC.
View all Electrical and Physical Characterizarion Capabilties
ELECTRON MICROANALYSIS
The bevvy of signals produced by the electron-specimen interaction can provide a range of useful information about your sample. X-ray microanalysis techniques such as energy or wavelength dispersive spectrometry (EDS or WDS) are available on many of our systems to provide high spatial resolution elemental analysis. In addition, some of our TEM systems are equipped with electron energy loss spectrometers (EELS) for elemental and chemical analysis. We also have crystal orientation mapping capabilities by electron backscatter diffraction (EBSD).
Our current range of microanalysis instruments can be found in our EPIC-SEM and EPIC-TEM Facilities.