Transmission electron microscopy (TEM) uses a high energy electron beam which is transmitted through a thin sample to provide information via the interaction of electrons with your sample. Modern TEM’s are a platform for a range of different types of experiments from atomic resolution imaging to structural analysis by electron diffraction to in situ or in operando methods, which provide controlled environments and allow application of stimuli to materials inside the microscope. Beyond imaging, TEM can be operated in Scanning TEM (S/TEM) mode to provide high spatial resolution elemental, chemical information and crystallographic information.

Our current range of TEM instruments can be found in our EPIC-TEM Facility.

For hydrated materials or beam-sensitive materials, cryogenic methods can be used to preserve structure and provide critical morphological or compositional information. Our facilities house a complete array of cryogenic sample preparation equipment and capabilities for cryo-TEM and cryo-SEM.

Our current range of Cryo-EM instruments can be found in our BioCryo Facility.

The bevvy of signals produced by the electron-specimen interaction can provide a range of useful information about your sample. X-ray microanalysis techniques such as energy or wavelength dispersive spectrometry (EDS or WDS) are available on many of our systems to provide high spatial resolution elemental analysis. In addition, some of our TEM systems are equipped with electron energy loss spectrometers (EELS) for elemental and chemical analysis. We also have crystal orientation mapping capabilities by electron backscatter diffraction (EBSD).

Our current range of microanalysis instruments can be found in both our EPIC-SEM Facility and our EPIC-TEM Facility.