Electrical Testing

services: Electrical Testing

Our facilities can help characterize electrical properties of materials and devices. We have multiple options for probe stations and advanced in situ probing capabilities.

RELEVANT TECHNIQUES:

ELECTRICAL PROBE STATION

The electrical probe station is fitted with six high resolution micromanipulators in a vibration isolation stage. The system is interfaced with both a semiconductor parameter analyzer and an LCR meter, which makes it possible to readily measure the resistance, capacitance, or inductance of a sample of interest.

Our current range of electrical probe station setups can be found in our NUFAB Facility and the Prtizker Nanofabrication Facility.

The GIANTFab core facility at Northwestern also contains an electrical probe station housed in an inert-atmosphere glovebox for measurements of air- or moisture-sensitive samples including organic and perovskite semiconductors. That system is interfaced with a source measure unit. It also contains a solar simulator and a monochromatic light source for measurements of photoactive materials.

View all Electrical and Physical Characterization Capabilties

SCANNING PROBE MICROSCOPY (SPM)

SPM is the general umbrella technique for a suite of miroscopy tools that can provide everything from nanometer-scale surface images to local piezoelectric property measurements. By varying the type of probe and feedback mechanism, these tools can probe electrical, mechanical and magnetic properties from a range of different materials.

Our current range of SPM tools can be found inour SPID Facility.

View all Scanned Probe Techniques

In Situ SEM NANOPROBE

For applications where precise placement of electrical probes are required, the in situ SEM nanoprobe can be used to probe small structures. This nanofabrication technique is especially useful for measuring the electrical properties of transistors on the nanometer length scale and electronic failure analysis.