
CHEMICALS & MATERIALS
From the analysis of raw materials and chemical formulations to the fundamental characterization of material properties (mechanical, thermal, electrical, optical), SHyNE Resource can provide you with access to advanced facilities and expert technical staff.
PRODUCT VALIDATON / COMPARISON
We provide a full service suite of tools and expertise to take raw devices and materials and process them into interrogable samples for a wide variety of material testing (in-situ and ex-situ). We can provide quantitative comparison between multiple systems from fundamental to macro scale on thermal, mechanical, chemical, and elemental characteristics.
- Capabilities: Raman/FTIR Spectroscopy, Scanning Electron Microscopy (SEM), Electron Backscattered Diffraction (EBSD), Energy/Wavelength Dispersive Spectrometry (EDS/WDS), Scanning Transmission Electron Microscopy (TEM/STEM), X-Ray Diffraction (XRD), X-Ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF), Nano-Indentation
CONTAINMENT ANALYSIS
From individual atoms to large scale imaging, we retain the expertise to identify trace elements and undesired surface species on a wide range of materials. Expert staff can assist in sample preservation and processing to preserve an accurate view of a specimen of interest.
- Materials: Metals, Ceramics, Composites, Coatings
- Techniques: Raman/FTIR Spectroscopy, Scanning Electron Microscopy (SEM), Energy/Wavelength Dispersive Spectrometry (EDS/WDS, X-Ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF), Nano-Indentation, Local-Electrode Atom-Probe Tomography (LEAP)
MATERIAL TESTING (IN-SITU/EX-SITU)
Regardless of property of interest, our facility can offer a one-stop-shop to the quantitative understanding of material/device performance. From traditional electronic probe measurement to local electronic and elemental structure, we provide a range of solutions targeted at your length scale of interest. We actively develop and research new methods of interrogating and linking material structure to property to provide state-of-the-art solutions.
- Materials: Metals, Ceramics, Polymers, Composites, Coatings
- Techniques: Raman/FTIR Spectroscopy, Scanning Electron Microscopy (SEM), In-Situ and Ex-situ Probe Measurements, Scanning Probe Microscopy, Scanning Transmission Electron Microscopy (TEM/STEM), X-Ray Diffraction (XRD), X-Ray Fluorescence (XRF), Nano-Indentation
METALLOGRAPHY/MICROSTRUCTURE
Leveraging the Northwestern commuity’s strong historical understanding of metals and metals processing, we provide world-leading expertise in the imaging and preparation of metallic specimens. Facility experts can provide assistance interpreting and understanding results from state-of-art systems.
- Materials: Metals, Composites, Coatings
- Techniques: Scanning Electron Microscopy (SEM), Electron Backscattered Diffraction (EBSD), Scanning Transmission Electron Microscopy (TEM/STEM), X-Ray Diffraction (XRD)
QUALITY ASSURANCE
We provide quantitative methods to evaluate the statistical variation in material structure and performance, allowing industry leaders to not only understand the ‘what’, but the ‘how’ and ‘why’.
- Materials: Metals, Ceramics, Polymers, Composites, Fibers, Coatings
- Techniques: Raman/FTIR Spectroscopy, Scanning Electron Microscopy (SEM), Electron Backscattered Diffraction (EBSD), Energy/Wavelength Dispersive Spectrometry (EDS/WDS), Scanning Transmission Electron Microscopy (TEM/STEM), X-Ray Diffraction (XRD), X-Ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF), Nano-Indentation
CORROSION & FAILURE ANALYSIS
Understanding dynamic processes of corrosion and failure analysis requires a complete treatment of the chemical, elemental, mechanical, and crystallographic state of materials and devices. Our center provides access to these disparate treatments in a unifying framework with a single access point, simplifying and reducing the time to an answer for critical industry leading systems.
- Materials: Metals, Ceramics, Polymers, Composites, Fibers, Coatings
- Techniques: Raman/FTIR Spectroscopy, Scanning Electron Microscopy (SEM), Electron Backscattered Diffraction (EBSD), Energy/Wavelength Dispersive Spectrometry (EDS/WDS), Scanning Transmission Electron Microscopy (TEM/STEM), X-Ray Diffraction (XRD), X-Ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF), Nano-Indentation, Local-Electrode Atom-Probe Tomography (LEAP)
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